Download Low-Power High-Speed Adcs For Nanometer Cmos Integration by Zhiheng Cao, Shouli Yan PDF

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By Zhiheng Cao, Shouli Yan

Low-Power High-Speed ADCs for Nanometer CMOS Integration is ready designing ADCs in nanometer CMOS tactics to achive reduce energy intake for a given pace and backbone than past designs via new architectures and circuits that benefit from distinctive good points of nanometer CMOS strategies.

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Measurement results show that the same code (10 ∼ 14 for the tested part) can be used for different sampling and input frequencies, and changed little if at all, over days of measurement and temperature variation (after applying cooling spray). It can be concluded that the majority of the timing skew is caused by component mismatch and layout asymmetry, and is affected very little by operating conditions and temperature variations. This means for most applications timing calibration can be performed at power up and fixed thereafter.

E. the previous comparator decision), the MOS channel is not completely formed (with drain = VDD and source = VDD-Vth) or formed (with drain/source = VSS), and hence presenting different load capacitance to the master dynamic comparator, resulting in much feared hysteresis. On the other hand, if they are connected to the bottom NMOS, the channel is always formed there regardless of the latched state, since drain/source are shorted to ground with the top NMOS turned off. The PMOS of the NAND gate is completely off hence does not present much data dependent load capacitance.

Nevertheless, because the die is very small compared with the package, long bonding wire cannot be avoided which could have limited the SFDR for high input frequency. Fig. 2 Characterization of the Clock Delay Line Before measuring the ADC, we need to characterize the clock delay line (cf. 3) that corrects for sampling timing skew between the two S/H, in order to find the right delay line code. Measurement results show that the same code (10 ∼ 14 for the tested part) can be used for different sampling and input frequencies, and changed little if at all, over days of measurement and temperature variation (after applying cooling spray).

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